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Cited article:

Automatic beam optimization method for scanning electron microscopy based on electron beam Kernel estimation

Yunje Cho, Junghee Cho, Jonghyeok Park, Jeonghyun Wang, Seunggyo Jeong, Jubok Lee, Yun Hwang, Jiwoong Kim, Jeongwoo Yu, Heesu Chung, Hyenok Park, Subong Shon, Taeyong Jo, Myungjun Lee and Kwangrak Kim
Communications Engineering 3 (1) (2024)
https://doi.org/10.1038/s44172-024-00230-3

Visual Servo Control for Workspace Navigation of Nanorobot End-Effector Inside SEM

Teng Li, Yuting Yang, Xiang Fu, Zhenhuan Sun, You Fu Li and Song Liu
IEEE Transactions on Automation Science and Engineering 21 (3) 3472 (2024)
https://doi.org/10.1109/TASE.2023.3279895

Methodology to evaluate the uncertainty associated with nanoparticle dimensional measurements by SEM

L Crouzier, A Delvallée, A Allard, et al.
Measurement Science and Technology 30 (8) 085004 (2019)
https://doi.org/10.1088/1361-6501/ab1495

Numerical Modeling and Experimental Investigation of the Breadboard Model of a Near-Field Interference Microscope

Victor Belichenko, Andrey Zapasnoy, Aleksandr Mironchev, A.V. Yurchenko and V.I. Syryamkin
MATEC Web of Conferences 79 01016 (2016)
https://doi.org/10.1051/matecconf/20167901016