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Cited article:

A Damage Path Dependence Mode Identification Method for SiC MOSFETs Due to Power Cycling Test

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Modelling of anisotropic high-cycle fatigue of metals

Reijo Kouhia, Niels Saabye Ottosen, Matti Ristinmaa, Arturo Rubio Ruiz, Sami Holopainen and Timo Saksala
European Journal of Mechanics - A/Solids 111 105601 (2025)
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Power Cycling Testing for Power Semiconductor Switches: Methods, Standards, Limitations, and Outlooks

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IEEE Transactions on Power Electronics 1 (2025)
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A continuum approach to multiaxial high-cycle fatigue modeling for ductile metallic materials

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International Journal of Fatigue 107929 (2023)
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High Cycle Fatigue Testing of Silicon IGBT Devices Under Application-Close Conditions

Christian Schwabe, Nick Thönelt, Josef Lutz and Thomas Basler
IEEE Transactions on Power Electronics 38 (11) 14516 (2023)
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High-cycle fatigue model calibration with a deterministic optimization approach

Arturo Rubio Ruiz, Timo Saksala, Djebar Baroudi, Mikko Hokka and Reijo Kouhia
International Journal of Fatigue 175 107747 (2023)
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Short- to long-term deformation behavior, failure, and service life of amorphous polymers under cyclic torsional and multiaxial loadings

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Continuous-time, high-cycle fatigue model: Validity range and computational acceleration for cyclic stress

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International Journal of Fatigue 136 105582 (2020)
https://doi.org/10.1016/j.ijfatigue.2020.105582