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Cited article:

Measurement Issues of Radio Frequency Integrated Circuits with Digital Control at Radiation Testing

Konstantin Amburkin, George Chukov, Vadim Elesin, Galina Nazarova, Nikolay Usachev

MATEC Web Conf., 79 (2016) 01041

Published online: 2016-10-11

DOI: https://doi.org/10.1051/matecconf/20167901041

This article has been cited by the following article(s):

Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects

M. E. Chernyak, E. V. Ranneva, A. V. Ulanova, et al.
Russian Microelectronics 48 (6) 415 (2019)
https://doi.org/10.1134/S1063739719060039

I. I. Shvetsov-Shilovskiy, A. B. Boruzdina, A. V. Ulanova, A. A. Orlov, K. M. Amburkin and A. Y. Nikiforov
1 (2017)
https://doi.org/10.1109/SIBCON.2017.7998542