Articles citing this article

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Cited article:

Study on the Die-Attach Voids Distribution With X-Ray and Image Processing Techniques

Aleksander Sesek, Olga Chambers and Janez Trontelj
Journal of Electronic Packaging 141 (2) (2019)
https://doi.org/10.1115/1.4042804

Proceedings of the 4th Congrès International de Géotechnique - Ouvrages -Structures

Van-Nhat Le, Lahouari Benabou and Quang-Bang Tao
Lecture Notes in Civil Engineering, Proceedings of the 4th Congrès International de Géotechnique - Ouvrages -Structures 8 172 (2018)
https://doi.org/10.1007/978-981-10-6713-6_16

Modeling of intergranular thermal fatigue cracking of a lead-free solder joint in a power electronic module

Van-Nhat Le, Lahouari Benabou, Quang-Bang Tao and Victor Etgens
International Journal of Solids and Structures 106-107 1 (2017)
https://doi.org/10.1016/j.ijsolstr.2016.12.003

Finite element analysis of the effect of process-induced voids on the fatigue lifetime of a lead-free solder joint under thermal cycling

Van Nhat Le, Lahouari Benabou, Victor Etgens and Quang Bang Tao
Microelectronics Reliability 65 243 (2016)
https://doi.org/10.1016/j.microrel.2016.07.098

Micromechanical model for describing intergranular fatigue cracking in a lead-free solder alloy

V.N. Le, L. Benabou, V. Etgens and Q.B. Tao
Procedia Structural Integrity 2 2614 (2016)
https://doi.org/10.1016/j.prostr.2016.06.327