Issue |
MATEC Web Conf.
Volume 355, 2022
2021 International Conference on Physics, Computing and Mathematical (ICPCM2021)
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Article Number | 03066 | |
Number of page(s) | 6 | |
Section | Computing Methods and Computer Application | |
DOI | https://doi.org/10.1051/matecconf/202235503066 | |
Published online | 12 January 2022 |
The design of the sampling parameters for CMM of free-form surfaces
School of Mechanical and Transportation Engineering, Guangxi University of Science and Technology, Guangxi Liuzhou, China
* Corresponding author: chenyueping99@126.com
In order to improve the inspection accuracy of free-form surface by CMM, this paper adopted the different sampling parameters to research the influence of the measurement accuracy of free-form surface. Through the combination of area uniform block random sampling and Latin hypercube random sampling, the minimum sampling grid block area and ball diameter were taken as the research parameters. Firstly, this research analysed theoretically the influence of measurement accuracy of free-form surface by different sampling parameters. Secondly, carrying out experiments verified the analytical results. Then, the influence of two groups of sampling parameters on the normal deviation of free-form surface could be acquired by analysing the experimental data. Finally, this research could obtain the result of normal deviation of free-form surface. The research results showed that the minimum block area of sampling and the diameter of measuring ball become smaller, and the profile error become larger when the number of measuring points were the same, the more it can reflect the actual contour of the free-form surface, which proves that the measurement accuracy is higher.
Key words: Free-form surface / CMM / Sampling parameters / Latin hypercube sampling
© The Authors, published by EDP Sciences, 2022
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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