Open Access
Issue
MATEC Web Conf.
Volume 75, 2016
2016 International Conference on Measurement Instrumentation and Electronics (ICMIE 2016)
Article Number 09007
Number of page(s) 4
Section System Modeling and Analysis
DOI https://doi.org/10.1051/matecconf/20167509007
Published online 01 September 2016
  1. A. J. Schwartz, M. Kumar, B. L. Adams, and D. P. Field, Electron Backscatter Diffraction in Materials Science, 2nd. ed. Springer, New York, (2009). [Google Scholar]
  2. E. Guilmeau, C. Henrist, T. S. Suzuki, Y. Sakka, D. Chateigner, D. Grossin, and B. Ouladiaf, ICOTOM 14, 179, (2005). [Google Scholar]
  3. S. Piazolo, V. G. Sursaeva, and D. J. Prior, ICOTOM 14, 213 (2005). [Google Scholar]
  4. M. V. Sypchenko, T. I. Savyolova, Cristallogr. Rep. 55 (4), 546 (2010). [CrossRef] [Google Scholar]
  5. A.O. Antonova, T. I. Savyolova, Comput. Math. Math. Phys. 55 (2), 317 (2015). [CrossRef] [Google Scholar]
  6. A.O. Antonova, T. I. Savyolova, Cristallogr. Rep. 61 (3), 1 (2016). [CrossRef] [Google Scholar]
  7. T. I. Savyolova, T. M. Ivanova, and M. V. Sypchenko, Methods for Solving Ill-Posed Problems in Texture Analysis and Their Applications, Mosk. Inzh._Fiz. Inst., Moscow, (2012) [in Russian]. [Google Scholar]
  8. N. Bozzolo, F. Gerspach, G. Sawina, and F. Wagner, J. Microscopy. 227, 275 (2007). [CrossRef] [Google Scholar]
  9. V.A. Gribkov, F.I. Grigoriev, B.A. Kalin, V.L. Yakushin, Advanced Radiation-Beam Technologies of Materials Treatment, Krugly God, Moscow, (2001). [in Russian]. [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.