MATEC Web of Conferences

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Few-shot defect detection in industrial scenarios: A comprehensive review of challenges, advances, and frontier trends

Ruibo Wang and Tao Hong

MATEC Web Conf., 413 (2025) 04005

Published online: 01 October 2025

DOI: 10.1051/matecconf/202541304005

Ruibo Wang

Tao Hong

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