MATEC Web of Conferences

Reliability testing and machine learning approach for modelling high-power light-emitting diode reliability

Quoc Tiep La, Zdeněk Vintr, David Vališ, Libor Žák and Zdeněk Kohl

MATEC Web Conf., 413 (2025) 03005

Published online: 01 October 2025

DOI: 10.1051/matecconf/202541303005

Quoc Tiep La

Zdeněk Vintr

David Vališ

Libor Žák

Zdeněk Kohl

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)