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Reliability testing and machine learning approach for modelling high-power light-emitting diode reliability

Quoc Tiep La, Zdeněk Vintr, David Vališ, Libor Žák and Zdeněk Kohl

MATEC Web Conf., 413 (2025) 03005

DOI: https://doi.org/10.1051/matecconf/202541303005

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