Study of impact of LATID on HCI reliability for LDMOS devicesChandrashekhar, Gene Sheu, Shao Mingo Yang, Ting Yao Chien, Yun Jung Lin, Chieh Chih Wu and Tzu Chieh LeeMATEC Web of Conferences, 44 (2016) 02007DOI: https://doi.org/10.1051/matecconf/20164402007