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Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects

M. E. Chernyak, E. V. Ranneva, A. V. Ulanova, et al.
Russian Microelectronics 48 (6) 415 (2019)
DOI: 10.1134/S1063739719060039
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I. I. Shvetsov-Shilovskiy, A. B. Boruzdina, A. V. Ulanova, A. A. Orlov, K. M. Amburkin and A. Y. Nikiforov
1 (2017)
DOI: 10.1109/SIBCON.2017.7998542
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