Measurement Issues of Radio Frequency Integrated Circuits with Digital Control at Radiation Testing
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), 115409, Moscow, Russia
* Corresponding author: email@example.com
The results of the development of a portable logical generator/analyzer to be used in an automated hardware and software measurement system for automation of research and testing of TID hardness of digitally controlled RF ICs, are provided. The device has been tested in research of precision parameters of integrated multi-bit RF vector phase shifters.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.