Using NI PXI Modules for Digital Signal Processing Microprocessor Testing
1 National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), 115409, Moscow, Russia
2 FSUO “MNIIRIP”, 141002, Mytishchi, Russia
* Corresponding author: email@example.com
The article considers the implementation of the external memory interface based on National Instruments modular PXI equipment for environmental testing of digital signal processing (DSP) microprocessors. The block diagram of the developed device pointing out the advantages and disadvantages of this solution is provided. The block diagram of an improved external memory interface is also shown.
© The Authors, published by EDP Sciences, 2016
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