Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX
National Research Nuclear University MEPhI, 115409, Moscow, Russia
* Corresponding author: email@example.com
The article presents the hardware-software complex for functional and parametric tests of ARM microcontrollers STM32F1XX. The complex is based on PXI devices by National Instruments and LabVIEW software environment. Data exchange procedure between a microcontroller under test and the complex hardware is describes. Some test results are also presented.
© The Authors, published by EDP Sciences, 2016
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