NI Based System for Seu Testing of Memory Chips for Avionics
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), 115409, Moscow, Russia
* Corresponding author: email@example.com
This paper presents the results of implementation of National Instrument based system for Single Event Upset testing of memory chips into neutron generator experimental facility, which used for SEU tests for avionics purposes. Basic SEU testing algorithm with error correction and constant errors detection is presented. The issues of radiation shielding of NI based system are discussed and solved. The examples of experimental results show the applicability of the presented system for SEU memory testing under neutrons influence.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.