Testing System for Analog Devices Direct Digital Synthesizer
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), 115409, Moscow, Russia
* Corresponding author: firstname.lastname@example.org
The paper is devoted to the setup for controlling and testing of Direct Digital Synthesizer (DDS) Integrated Circuits (ICs). Control and measurement setup is designed on the basis of National Instruments module equipment PXI-4110, PXI-7841R and LabVIEW development environment. Block diagram of the developed system and software structure are depicted as well as test results for several ICs.
© The Authors, published by EDP Sciences, 2016
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