Recent TEM developments applied to quantum structures
1 CNRST, angle Allal-Fassi/FAR, Madinat al-irfane, 10000 Rabat, Morocco
2 CNRS-CRHEA, Rue Bernard Grégory, Sophia Antipolis, 06560 Valbonne, France
3 Max-Planck-Institute for Intelligent Systems, Heisenbergstr-3, 70569 Stuttgart, Germany
To shed light on these confined properties, a technique with a high energy-and-spatial resolution is of absolute need. Modern transmission electron microscopy (TEM) is the most suitable technique for a direct measurement of optical and structural properties at a nanometer scale. Thanks to the successful construction of aberration corrected transmission electron microscopes, the mapping of atomic positions with high accuracy becomes a routine experiment enabling therefore a more intuitive interpretation of structural deformation (strain). In addition, the recent development in energy-filters, especially when coupled to monochromated electron-beams, measurements of physical properties are achieved with unprecedented performances. The case of individual buried GaN/(AlGaN) quantum dots is discussed.
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